Science method

X-ray Diffraction - Science method

The scattering of x-rays by matter, especially crystals, with accompanying variation in intensity due to interference effects. Analysis of the crystal structure of materials is performed by passing x-rays through them and registering the diffraction image of the rays (CRYSTALLOGRAPHY, X-RAY). (From McGraw-Hill Dictionary of Scientific and Technical Terms, 4th ed)
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hello
Is it possible to confirm the presence of defects using XRD analysis?
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Yes, Sir you can detect defects from XRD analysis, you just have to use the Williamson and Smallman method to find out the dislocation density in your material.
Hope I provided the answer you are looking for.
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When I refined my XRD data by using GSAS software, the GOF value always came out at more than 4. My material is an O3-type layered transition metal oxide cathode material.
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Dear friend Bibi Safia
Well, when it comes to XRD refinement, the Goodness of Fit (GOF) is indeed an essential parameter. Ideally, you'd Bibi Safia want a GOF value as close to 1 as possible, indicating a perfect fit between the observed and calculated patterns. However, it's rare to achieve a GOF of exactly 1 due to experimental errors and limitations in modeling.
In the case of XRD refinement using GSAS software, a GOF value of more than 4 is quite high. While there's no hard and fast rule, a GOF value of less than 2 is often considered acceptable in many cases. It indicates a reasonably good fit between your Bibi Safia observed data and the calculated pattern.
Now, let's address your specific scenario. You Bibi Safia mentioned your material is an O3-type layered transition metal oxide cathode material. These materials often have complex structures, which can make achieving a low GOF challenging. However, a GOF value of more than 4 suggests that there might be some issues with your refinement.
Here are a few things to consider:
1. **Data Quality**: Ensure that your Bibi Safia XRD data is of high quality, with good signal-to-noise ratio and minimal artifacts.
2. **Instrument Calibration**: Check if your Bibi Safia XRD instrument is properly calibrated. Incorrect calibration can lead to inaccuracies in your data.
3. **Modeling Parameters**: Review the parameters used in your Bibi Safia refinement. Make sure they accurately represent the crystal structure and properties of your material.
4. **Peak Broadening**: If your Bibi Safia peaks are broad, it might indicate issues like micro-strain or crystallite size variation. Adjusting these parameters can improve your fit.
5. **Background Subtraction**: Ensure that the background subtraction is properly done to avoid interference with peak intensities.
6. **Phase Purity**: If your Bibi Safia material contains multiple phases, ensure that you're refining each phase separately.
7. **Refinement Strategy**: Experiment with different refinement strategies and software settings to see if you Bibi Safia can achieve a better fit.
Remember, XRD refinement is both an art and a science. It often requires some trial and error to get the best results. Don't hesitate to explore different approaches until you Bibi Safia achieve a satisfactory fit.
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I would be extremely grateful if someone could help me find the following cards:
  • CaZnOS PDF-01-072-3547
  • SrZnOS PDF card # 041-0551
  • BaZnOS PDF #17-1239
  • Ba0.5Na0.5TiO3 - SrTiO3
Thanks a lot!
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Sir, please find the attached file for SnZnOs
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(101) and (10¯11) are the same plane for epsilon phase (HCP) of XRD peaks?
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A hexagonal crystal structure (and trigonal ones usually as well) uses a base with equivalent vectors a and b at an angle gamma = 120 between these vectors. The third vector c is normal to the a-b-plane and of any length compared to a and b. The Miller indices hkl of a lattice plane are calculated by taking the intercepts opq of the lattice plane with the three base vectors. The intercepts are first converted to 1/o, 1/p, 1/q where a o,p,q=infinity results in the reciprocal value zero. For surface facets the values 1/o, 1/p, 1/q are multiplied by a common multiplier to give the smallest set of integers free from common dividers, these are the hkl.
In the hexagonal base the vector -(a+b) is symmetrically equivalent to vectors a and b ( it is obtained by a 120° rotation). Thus this third (redundant) vector can equally well be used as base vector. The Miller index with respect to this third axis is referred to as "i" and the triplet of Miller indices becomes a quadruplet:
h k l => h k i l
with i = -(h + k)
The advantage of this notation is that the 120° rotation transforms the Miller indices in a cyclic fashion : h k i l => i h k l => k i h l
which makes the symmetry relationship more obvious. (yes only hki do the cyclic permutation!)
Thus, yes 1 0 1 and 1 0 -1 1 (== 1 0 bar1 1) are the identical lattice planes in a hexagonal or trigonal structure.
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The above is the X-ray diffraction diagram from the iron nano sample that I synthesized from green tea extract. Could you please explain the characteristic peak at the 80-degree position?
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A quick search on the powder diffraction pattern of amorphous carbon did not show me any pattern beyond 60° 2Theta @ CuKalpha. Any higher order peaks will be extremely low in intensity.
According to a compilation of Fe-C (BCC) (Liu Cheng, A. Boetttger, Th.H. de Keijser, E.J. Mittemeijer, Scripta metallurgica, 1990, 24, 509) lattice parameters shows that the lattice parameter changes from 2.8665A up to roughly 3.08A with increasing Carbon content (8 Atom% max). This change in the lattice parameter is sufficient to shift the Fe reflections down in 2Theta to values where the peaks in your pattern seem to be. See attached calculated powder diffraction pattern for a=3.05A and a sphere of 20 A diameter. With the relative intensities, I do not think that this explains your 80° 2Theta peak.
Check the composition of your sample, how much Fe is there compared to C? Can you prepare a pure carbon sample and run the powder pattern for this by itself. As there is a small peak at ~16° 2Theta I suspect that you have some organics/polymers in your sample that may introduce more order, thus increasing peaks at high 2Theta as well.
I guess you might produce (Fe,C) under very reducing conditions. The other magnetic Fe phase would be magnetite Fe3O4, peaks would be at much lower 2Theta.
Generally, run the powder pattern with at least twice the counting time to reduce the noise, as all peaks are broad you can double the step width without loosing too much information.
Gustavo Henrique de Magalhães Gomes All amorphous materials do show short range order between the first to (roughly) third/fourth neighbor atoms. These reasonable well defined interatomic distances most certainly produce at least a first, so called "first sharp diffraction" peak, even if this is commonly roughly 5 to 10° FWHM @CuKalpha. Check out the literature on "Glass" diffraction pattern as examples.
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I am removing the Pb(II) from wastewater using copper nanoparticles. I have done FITIR and XRD analysis after the adsorption of Pb and there is clear change in the peaks in both FTIR and XRD.
In XRD 2 theta at 32.9 degree indicates formation of Pb-OH. Whereas the typical peaks of Cu2O diminished. What reaction could possibly has occurred? I am unable to conclude. Kindly guide me.
Also there's clear difference in the peaks some have shifted and doublet turned to single.
I will be grateful for your help.
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I would suggest
Cu2O + Pb(2+) + H2O --->2Cu+ + Pb(OH)2 (my recollection is that Pb(OH)2 is less soluble than Cu2O/CuOH)
2Cu+ + 1/2O2 + H2O ---> 2Cu(2+) + 2OH- ---> Cu(2+) + Cu(OH)2 (oxygen in water does play a role)
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I have prepared a glass sample and the XRD looks a bit different than normal. The peak is very low intense and it is shifted towards 10 degree. What could be the possible reason for that? How can I interpret the XRD?
The glass was produced at 2000 degree C instead of 1500 degree C. Could that be the reason?
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Your images do not include the x-axis. You do not mention the radiation, nor the diffractometer type used for the experiment. Without this absolutely necessary information, which needs to always be included with any kind of powder diffraction measurement, no help is possible.
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Hello everyone, I'm a student conducting research. I synthesized pure TiO2 NRs under the same conditions, with identical temperature and duration for calcination. The only difference lies in the hydrothermal time; the blue line was synthesized with the shortest duration, while the red line represents the longest. However, I observed a peak shift in the XRD results. Could it be due to crystallite size or is there something wrong with my sample?
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A shift of the whole pattern is due to change in lattice parameters, according to Braggs' Equation. The green pattern shift to the left means that the unit cell is bigger than the one in blue. Feel free to reply if you need more help about this.
Sincerely
Ricardo Tadeu
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I recently conducted an AFM of metal oxides to get information about the size, shape, and arrangement of the grain. However, I couldn't find any grains in the obtained result (procedure for AFM image done by using Gwyddion software). This result brought me confusion, which could be due to analysis issues or possibly my incorrect interpretation. However, I have received the correct results of XRD, FTIR, and FE-SEM of the same material, which suggests that there is no issue with the synthesis method. Anyone who has experience with AFM will help me solve this issue. Thank you so much for the time.
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Jürgen Weippert thank you for giving me an informative response.
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I am struck with finding the reference source to plot and match my XRD data. Please can any one share me the file of above mentioned JCPDS Card no file/pdf
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I manage a lab with a diffractometer and we have access to the ICDD database.
I find it hard to believe that an institution with a diffractometer would not also have made arrangements for identifying phases. I think JCPDS access would be the norm, not the exception.
What will you do if you phases you ask about do not match the pattern you obtain? There are thousands of other compounds and many possibilities, but how will you find them? I don't think you should restrict yourself to what someone else researching that material has published.
The researchers we work with may wish that everything matches one of a couple of possibilities. However, we often run into new phases whether that is from a failed experiment or contamination.
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I recently conducted an AFM of metal oxides to get information about the size, shape, and arrangement of the grain. However, I couldn't find any grains in the obtained result (procedure for AFM image done by using Gwyddion software). This result brought me confusion, which could be due to analysis issues or possibly my incorrect interpretation. However, I have received the correct results of XRD, FTIR, and FE-SEM of the same material, which suggests that there is no issue with the synthesis method. Anyone who has experience with AFM will help me solve this issue. Thank you so much for the time.
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It would be nice to have the FE-SEM image of the same sample showing the grains. I am curious if the scales are the same. AFM could be scanning a much larger or smaller area. If you are only scanning a partial grain by AFM, it will not be helpful.
What is the z-scaling on your sample? I saw a local researcher have severe tilt on their sample from side to side. The little bit of surface variation was dwarfed by the tilt.
And if you have grains by FE-SEM, why are you doing AFM? Or was FE-SEM done for some other purpose? (I cannot see how FTIR would add information about grain structure. XRD could.)
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Greetings
I've been searching for quite a while about Covalent organic framework (COF) and Porous organic polymer (POP) XRD pattern, how their xrd pattern should be and their differences.
But i could not find any specific findings.
some texts mentioned that COF xrd pattern should be sharp and pop should be broad. But ive seen so many COFs with broad PXRD pattern.
How can you distinguish between these two? How could you know that your product is POP or COF (etc. )?
Can somebody share their knowledge or mention a helpful Paper? Im so confused.
Thanks a lot.
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Hi everyone!
I have done the lead adsorption studies and did the XRD of adsorbed nanocomposite. I observed new peaks in XRD diffractogram after the adsorption at 2 theta=33.01, 34.7, 37 and 40.2. I have searched the literature they are associated with PbO and Pb(OH)2 but not sure which one's are specifically for the one. Also unable to identify the miller indices.
I will thankful for your help.
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Noor Ul Ain The new peaks you observed at 2 theta=33.01, 34.7, 37 and 40.2 might not necessarily correspond to PbO or Pb(OH)2. They could be indicative of other lead-containing compounds formed during the adsorption process.
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I will use above JCPDS card in my XRD data.
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I am trying to perform the quantitative analysis of minerals in my samples. I have the XRD raw data of my samples. I started Rietveld refinement in X'pert Highscore and Match!* software but there was an error showing in these two software.
I have attached the image which shows the error during Rietveld refinement.
Please help me, If there are any other method for quantitative analysis of mineral percentage.
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Thank you Ricardo Tadeu Maia for answering my question, I have downloaded the CIF file of minerals present in my sample.
Can you tell me what I should do further or how to start refinement with these CIF files?
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I'm doing a XRD/XRF analysis for sandstone sample from a borehole, the sample is mixed with other materials from the drilling fluid like graphite and marble, all these material falling in range 20 - 150 microns, that makes it hard to get results from the analysis; so any ideas about how to remove the graphite and marble?
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I can only recommend using flotation for separation. Graphite is poorly wetted by water. It can be separated first. It is more difficult to separate sand and marble. But flotation reagents can be selected experimentally for them. If you take up this technology, you can create an invention. There may already be patents on this topic.
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Is there any formula to calculate stress
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Dear Chaithra D R ,
please 'google' for that topic...
you will find a lot of search results...
See for example:
Good luck and
best regsrdas
G.M.
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I characterized CuCdS with XRD, have plot the graph and i need JCPDS file to match the peaks.
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Hello
When you give your sample for XRD analysis, they also give the JCPDS analysis result along with it. You can also get it using the relevant software. Because this software has a library of material specifications and you can use it.
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While analyzing samples of monoclinic copper oxide using X-ray diffraction, we find two clear peaks in the XRD pattern that prove the nature of its structure type, but we cannot calculate the lattice constants (four unknowns). How to calculate the lattice constants for monoclinic copper oxide (CuO) from XRD (if there are fewer than four peaks)?
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It depends on the Miller coefficients that you had in the X-Ray analysis. In all cases, the more peaks there are, the lower the error rate and the ease of calculation. See the following law.
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appreciate it so much if someone could help me providing the card information!!
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you can find jcpd card number through Xpert high score plus
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I tried to synthesise different morphologies by adjusting the ratio of DMF to methanol. When the DMF and ethanol ratios were 9:1 and 7:3, the XRD images of the samples showed a diffraction peak not belonging to MIL-125 at around 8°. When the DMF and ethanol ratios were 5:5, The XRD of the sample is completely different from MIL-125. I can't determine the composition of the sample.
Why is this happening?
What is the composition of a 5:5 sample?
I'd appreciate it if someone could respond.
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The overlapped traces are much better for comparison and showed two completely different crystalline structures. In addition, the crystallinity of the one in colour was much lower than the other and may contain much higher amorphous content.
Interestingly, both showed the diffraction peak at about 8deg, as you said, not belonging to that of MIL-125, indicating potential impurities in your two samples.
If you don't have other techniques to characterise your samples, you could run more xrd on your samples after different treatment of your samples, such as drying in oven and/or purging with nitrogen gas, in short and longer time; or simply grinding gently and coarsely, to see the changes in xrd if applicable.
BTW, xrd is not the technique to define the materials composition but only their crystallinity, i.e. crystalline structyres and amorphous content. Having said that though, it is good to spot on different polymorph if applicable and impurities.
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Does anyone possess a pdf of CsPbBr3 card?
I need to check my XRD peak with reference peak.
Thank you.
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Guhyeon Jeong An orthorhombic CsPbBr3 JCPDS file is attached.
I really hope this is useful to you.
Warm regards,
Alvena Shahid
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济南大学周伟家课题组招聘1-2名博士后
一、济南大学招收博士后简介
济南大学前沿交叉科学研究院周伟家教授、逄金波副教授因课题需要,拟招收全职博士后1-2名,(注:博士后申请人科研成果特别突出者,可通过师资博士后身份入站,享受师资博士后出站后可直接入职济南大学待遇)。
研究方向
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另外,课题组根据博士后年度科研业绩,额外发放年终绩效。(2) 科研经费:学校提供一定科研经费。
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全职博士后,站中可评副教授。
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更多优惠条件,以济南大学人力资源处、人才工作办公室最新公布的政策为准。
二、单位简介
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济南大学是山东省人民政府和教育部共建的综合性大学、山东省重点建设大学、山东省高水平大学“冲一流”建设高校,具有学士、硕士、博士学位授予权。前沿交叉科学研究院是济南大学为了适应科研和教育的快速发展,推进国务院提出的世界一流大学和一流学科建设,于2016年投资筹建的具有鲜明学科交叉特色、适应国际前沿交叉科学研究趋势的研究机构。依托前沿交叉科学研究院已建成山东省生物诊疗技术与装备协同创新中心、分子诊断技术与装备山东省高等学校实验室等2个省部级科研平台。前沿交叉科学研究院将以学科交叉与学科融合为研究特色,以新型医药和现代能源核心技术为研发目标,在生物传感与再生医学、可再生能源转化高效利用和信息材料等相关领域开展基础和应用基础研究。以重大原始创新为驱动,以微纳传感、生命组织重建及纳米能源材料等重大核心技术突破及其在癌症早期诊断、组织修复、环境保护和新能源等领域的应用为牵引,带动和促进相关技术的转移转化与产业化,成为原始创新基地和高水平创新人才培养摇篮承担国家重大科研项目。研究院根据学科布局和研究目标,目前已设立微纳传感与组织工程、微纳能源材料与器件、信息材料与器件等研究方向,已建成微纳材料制备、微纳材料表征、环境与生物等研究平台,并将成立相关省级研究平台支撑交叉学科的建设。 前沿交叉科学研究院以国家杰青刘宏教授为首席科学家,借助“山东泰山学者”、“济南大学龙山学者”等主要人才计划支持,吸引和凝聚海内外一流的创新人才,建设一支高水平富有活力的国际化创新团队。学院通过在全球范围内广招贤士,汇聚不同专业的研究人才,在较短时间内建成具有国际影响的研究基地,形成了骨干成员20余名的高水平的交叉学科研究团队,团队成员的专业构成有材料学、化学、化工、能源、生物、物理微电子等,其中国家杰青、国家优青、泰山学者、山东省杰青、山东省优青等人才近20名。研究院已经建成了包括场发射扫描显微镜、XRD、共聚焦扫描显微镜、拉曼光谱仪等测试表征设备和各种沉积设备、材料制备设备及微加工设备等在内的高水平研究测试平台。研究院主页:https://iair.ujn.edu.cn/index.htm(2) 济南大学化学工程与技术博士后科研流动站
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三、博士后导师简介
周伟家,济南大学前沿交叉科学研究院副院长,博士生导师,学术带头人。主要从事能源催化和功能器件相关研究,在氢能源、二氧化碳资源化和催化电池等方面取得一系列研究成果,以第一或通讯作者在Energy Environ. Sci, Angew. Chem. Int. Ed., Adv. Energy Mat.等期刊发表SCI收录论文100余篇,被他引15000余次,H因子60,中国百篇最具影响力国际学术论文1篇,ESI高被引用论文11篇;中国化学快报、物理化学学报、BMEmat、SusMat期刊的青年编委、交叉学科材料学术编辑和ECS Sensors Plus顾问编辑;授权发明专利16项。主持国家优秀青年基金、国家重点研发计划课题、山东省杰出青年基金、山东省泰山特聘学者,山东省重点研发计划等国家省部级项目12项。获得山东省青年科技奖(2022)、山东省自然科学一等奖(3/5,2019)和中国颗粒学会自然科学二等奖(1/5,2022)。个人主页:https://faculty.ujn.edu.cn/zhouweijia/
合作青年教师简介
逄金波,济南大学前沿交叉科学研究院副教授,硕士生导师,济南市科技成果转化研究会副会长。主要从事二维材料可控制备及信息器件相关研究,在晶圆级二维材料制备、光电器件阵列和柔性传感等方面取得一系列研究成果,以第一或通讯作者在ACS Nano, InfoMat, Adv. Energy Mater.和Nano-Micro Lett.等期刊发表SCI收录论文40余篇,被他引6000余次,H因子38, ESI高被引用论文8篇;信息材料InfoMat与信息科学InfoScience、能源电化学eScience、纳微快报Nano-Micro Lett.、纳米研究Nano Res.、探索Exploration、交叉脑科学Brain-X、仪器仪表学报Instrumentation、结构化学CJSC、化学化工前沿FCSE、钨科技Tungsten等期刊青年编委;Nature Electronics、Adv. Mater.、Angew. Chem.和ACS Nano等期刊审稿人;授权发明专利5项。主持国家自然科学基金(2018),山东省优秀青年基金(2023)和山东省自然科学基金(2019)等国家省部级项目3项。获得中国发明协会创新创业奖一等奖(2/6,2023)、中国产学研合作促进会2023 年产学研合作创新成果奖优秀奖(2/10,2024)和2023第十届山东省大学生科技创新大赛省二等奖首位指导教师(1/2,2023)。个人主页:https://faculty.ujn.edu.cn/pangjinbo/
四、博士后培养业绩
(1) 1名博士后在站期间,获得山东省博士后创新计划、国家自然科学基金和青年泰山学者等项目人才计划,留校担任教授、博士生导师;
3名博士后出站,留校,获得国家自然科学基金,担任硕士生导师、讲师,科研成果达到副教授聘任要求;
1名博士后出站,赴友校担任副教授、硕士生导师。
(2) 博士后多人次在Nature Commun.、ACS Energy Lett.、Nano Energy、Adv. Sci.等期刊发表第一作者论文。
五、联系方式
(1) 将个人简历(教育背景、工作经历、论文专利和获奖情况等)及支撑材料等打包成pdf(包含近5年代表性论文的首页pdf)。发送到邮箱: [email protected][email protected] (逄老师) 。
(2) 邮件主题为“济南大学博士后-姓名(例如张三)-博士研究方向”。
(3) 热情欢迎优秀博士们加入课题组,共同攻关交叉前沿,科研成就美好人生!
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السلام عليكم عيدكم مبارك كل عام وانتم بخير
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The Powder XRD pattern of a dinuclear metal complex does not match with the simulated single-crystal XRD pattern. What can be the reasons?
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as Ricardo Tadeu Maia said the reasons of the absence of match can be different. If the positions of peaks are different maybe errors in the unit cell (space group, lattice parameters..) are present, while when the intensities are different the reasons could be due to the cell content or to preferred orientation in the powder. You should provide more details
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I need to perform Residual stress measurement by XRD using sin2 ψ method for SLM components, So what are the inputs (like sample size.....) I should give to the XRD operator, and what outputs I will get from there
Can someone (Those who did the experiment) explain this 🙏🏻🙏🏻, Your answer can help my research.
If possible I will send a direct message to the commentators, to ask more questions in this
Thanks in adavance 🙂
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You may find some useful information in the preprint article link http://dx.doi.org/10.13140/RG.2.2.23849.40808
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I have obtained XRD results for thin film in bulk mode, kindly suggest different methods to evaluate the residual stresses.
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For this, please refer to the preprint article link http://dx.doi.org/10.13140/RG.2.2.23849.40808, titled “Determining and quantifying chemically produced stresses in (atoms of) electronic and crystalline materials”
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In spinel ferrite-type samples we can see this kind of cases.
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Can you better explain your question please? You mean an increase in background?
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In XRD analysis, when we move to a higher angle, like above 50 degrees, if I have two reference lines of different phases, one matches the peak and the other is towards the right of the peak with a deviation of 0.5 degrees. Which one should I consider?
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the peak in the image you attached is clearly composed by a kalpha1 (low angle) and kalpha2 (high angle), having the second a half intensity with respect to the first. I suppose that you do not use a monochromatic radiation for the pattern collection. This effect is well evident for sinterized materials and at high angle. If I understand your question you should find an agreement with only the first peak at lower angle, the second is the same, due to the same phase
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Hello,
I was elaborating thin films from FeCl3 using a dip coater. These films were deposited on a glass sheet for 6 layers and then annealed at 500°C. However, XRD analysis did not yield any results or peaks! What could be the problems?
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How do you collected XRD patterns? Grazing angle or normal configuration? Do you expect to have crystalline materials after your thermal treatment? Is it possible that amorphous phases form?
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I think that the XRD for thin film also measured the grain size
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Hey there Nadir Fadhil Habubi! Great question. When the crystallite size estimated by XRD matches the grain size for thin films, it typically means that the XRD analysis is indeed capturing the grain size accurately. In thin films, XRD can provide valuable insights into both the crystal structure and the size of the crystallites or grains within the film. When these two measurements align, it suggests that the XRD technique is effectively probing the structure of the thin film, including the grain size. So, to answer your Nadir Fadhil Habubi question directly, yes, XRD for thin films can indeed measure the grain size, and when the estimated crystallite size aligns with the observed grain size, it indicates a reliable assessment of the film's structure.
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What is the recommended scanning range in degrees (minimum and maximum angles) and the recommended step size for the X-ray diffraction analysis of a composite (XLPE with zinc oxide)?
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Dear Faouzi Hassaine ,
For X-ray diffraction (XRD) analysis, the recommended scanning range and step size can vary depending on factors such as the specific materials being analyzed, the desired resolution, and the instrumentation available. However, I can provide some general guidelines:
Scanning Range:
For ZnO: Relevant peaks typically show up between approximately 30° (e.g., 100 peak) and 90° (e.g., 203 peak) in 2θ (where θ is the scattering angle). Therefore, the scanning range for ZnO could start around 10° to 100° in 2θ.
For XLPE: Significant information may be observed around 20°, but part of it could be a broad amorphous hump. Therefore, the scanning range for XLPE could start around 10° to 30° in 2θ.
Step Size:
Small values of instrumental peak broadenings in XRD are typically around 0.1° in 2θ. Therefore, the step size should be much smaller to ensure adequate resolution. A commonly used step size could be around 0.02° to 0.05° in 2θ.
For the composite material (XLPE with zinc oxide), you would ideally want to cover the scanning ranges relevant to both components. Therefore, a combined scanning range could start from around 10° to 100° in 2θ, covering the ranges for both ZnO and XLPE. Similarly, the step size should be chosen to ensure sufficient resolution, typically around 0.02° to 0.05° in 2θ.
These recommendations provide a starting point, but it's essential to optimize the scanning parameters based on the specific characteristics of your samples, the expected peak positions, and the resolution requirements of your analysis. Additionally, the recommendations may vary depending on the XRD instrument and the specific experimental conditions. Adjustments may be necessary based on preliminary scans and the desired quality of data.
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Hello everyone
I have some problems to analysis the xrd results to get the corresponding 3D structure of my protein with x'pert high score plus.
Does enyone have valuable suggestions?
Thanks
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Of course
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In XRD, I think there is a significant relationship between the target and the filter here, and the target has one more proton than the filter, is this true or false? What is the reason in both cases?
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the reason for that is found in the energy distribution of the electron energy levels of the atoms, which depends on the atomic number (i.e.the number of protons in the nucleus).
For the emission energies (K-alpha in the XRD case) of the x-ray targets please have a look at:
(please click on "Table 1-2 (pdf format)" there..
For the energy leves (K-edges; K 1s column) in the case of XRD filters, please have a look at :
(please click on "PDF version of this table") there...
Comparing the K-alpha lines energies and the filter K-edge energies according to your blue coloured table, you can confirm the relative shift of 1 atomic numbers between target material and filter material.
Best regards
G.M.
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As we know scherrer equation is limited to nano-scale crystallites, what are the other methods to calculate crystallite size if the size ranges above 100nm? Our obtained crystallites are above 100 nm. I have a pdf of XRD data of my sample, in which the sizes have been automatically measured. I want to know on basis of which method the XRD instrument calculated the size.
Any kind of help is highly appreciated.
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You can calculate particle grain size Using Scherrer's Equation from XRD pattern of compound.
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I have deposited iron titanate thin films by electrodeposition at different molar concentration.
Q #1. In XRD pattern of as deposited I don't observe any intensity peak while after performing MF annealing at 300 degree Celcius, I observed intensity peaks. what's the basic reason behind this?
Q #2. At different molar concentration I observed different peaks except two peaks appeard on same plane. what will be main cause behind this?
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Dear Gerhard Martens
Thank you for such a useful information.
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Hello everyone
1. Please suggest a robust free software to analysis the XRD results to obtain the corresponding 3d structure of a protein.
2. Is the xrd diffractogram with only a single peak better than a diffractogram with multiple peaks or vice versa? And what are the reasons?
3. What does raw.file show after xrd analysis?
Thanks to all
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Xpert High score software
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I have a concern regarding readjusting the intensities value of xrd data. In one the discussion in this platform, (the link is here- https://www.researchgate.net/post/What_could_be_the_reason_for_not_having_further_low_chi_square_value_better_agreement_in_my_refinement_result) it is said that the intensities value height can be readjusted to get good chi square value even though all the peaks are very well matched but the Chi square value is not low. Is this authentically correct or are we manipulating the data by resizing the height of the xrd peaks which we get. If it is correct, then who decides up to what resizing amount should the intensities be done/changed so to get good Chi square value?
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When aiming for a good chi-square value in peak fitting, it’s essential to recognize that adjusting intensity is not a solution because intensity carries valuable information related to factors like disordering and texturing. Instead, consider incorporating aspects such as preferred orientation or accounting for disordering during your fittings. These additional considerations can lead to more accurate and meaningful results.”
Remember, the interplay between various parameters (especially u, v, and w) is crucial for robust peak fitting.
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Dear all,
Three alloys cast in the same conditions and with equal dimensions were subjected to X-ray diffraction. Alloy 1 has dual-phase delta and gamma, but in alloys 2 and 3, with the increase of the chemical composition ratio, the fraction of the gamma phase decreases, but the delta phase increases. According to the attached image, the diffraction intensity of alloy 2 is significantly reduced compared to the other two alloys. With several times of surface exfoliation and repetition of diffraction, the results of alloy 2 also did not change.
Professors and researchers, please advise me on this problem, what factor can cause this unusual change and decrease in X-ray diffraction intensity?
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Thanks so much for the helpful points,
Best Regards
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  1. This is to know the orientation of the crystals in the peaks (hkl) in the (XRD) pattern.
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Edward Andrew Payzant Do you have better information about these stages? These phases in tin-based Babbitt alloy generally consist of three phases, namely: Sn-matrix, SnSb, and CuSn
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For example we can find the main phases using XRD, but I wanna know how to find the dopants, sintering aids, etc.
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If you espect light elements which in XRF in air are not detectable, you may use WDX in vacuumm, which yield also sensitivity down to 0,01wt% and can also measure elements like B, N, O, F, Na, Mg. - XRF in vacuum should also be able to measure light elements.
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i have some XRD data in which some samples shows around 47% iron Oxides content in the sandstone. which is confusing for me.
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Abdul Bari Qanit Yes, it is possible for iron-oxides to be present around 47% in a sandstone. The exact percentage can vary based on the specific sandstone formation and its geological context.
  • Palacky, G. J. (1988). Resistivity characteristics of geologic targets. Electromagnetic methods in applied geophysics, 1, 52-129
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How to get JPDS [ XRD] reference to compare XRD patterns obtained for activated carbon prepared from agriculture waste ?
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Dear friend Khaled F. El-Nemr
Ah, JPDS [XRD] reference? That's a crucial piece to the puzzle when comparing XRD patterns for activated carbon derived from agricultural waste. Here's the scoop: you Khaled F. El-Nemr want to dig into the literature and find a JPDS (Journal of Powder Diffraction Standards) reference that aligns closely with the material you're working with.
Start by hitting the databases. Look for articles or papers that have thoroughly characterized activated carbon samples using XRD. Once you've got your hands on a promising reference, scrutinize it closely. Pay attention to the methodology, sample preparation techniques, and, most importantly, the XRD patterns.
Compare those patterns to the ones you've obtained for your activated carbon. Look for similarities, differences, peaks, and trends. This comparison will help you Khaled F. El-Nemr gauge the structural properties and crystallinity of your material in relation to the established standards.
Remember, precision is key. Ensure your measurements are accurate, and your comparisons are meticulous. With a solid JPDS reference in hand, you'll be well-equipped to analyze and interpret your XRD data with confidence.
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If yes how to prepare sample for it ? Should I place the hydrogel pellet under XRD ?
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The crystallinity of gel structure can be determined by X-ray Diffraction analysis (XRD) using wide angle diffractometer.
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Hello, everyone! I would like to know whether there is a method to calculate the fraction of bcc, fcc and L12 phases in high-entropy alloys by XRD results, thank you very much!
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A technique called Rietveld refinement allows to determine the quantitative phase fraction of all phases that are present in a sample. Available software is for example Fullprof, GSAS-II, Maud, Jana, Topas.
These program typically come with a broad set of tutorial examples and manuals.
There are several good reviews to read.
For you materials the Bragg reflections will likely overlap considerable, thus the refinement must be done carefully likely with constraints on parameters to avoid exceesive parameter correlations.
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Hello,
I wondered how the XRD peaks tell you the crystal's preferred orientation of the crystal. For example, if a crystal has only three peaks at (200), (400), and (600), how is it interpreted that the preferential growth direction is (100)? Also, does (100) mean that layer is stacking in an a-axis direction for a 2D material?
Thanks in advance!
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The most common X-ray diffractometer uses a flat stationary sample holder, which is referred to as Bragg-Brentano geometry.
For such a stationary diffractometer, the intensity of a Bragg reflection is proportional to the relative number of crystallites in the sample that happen to be in an orientation with the hkl plane parallel to the sample surface. In this geometry, only those crystals will diffract the incoming xrays that happen to be oriented with the respective (hkl) plane parallel to the surface.
If all crystals are randomly oriented, this probability is independent of the indices hkl. If on the other hand more you have preferred orientation, a group of lattice planes will be more likely to be parallel to the surface compare to other reflections. The relative intensity of Bragg reflections of this group of lattice planes will be increased compared to that of other hkl groups.
In your case, if the diffraction pattern shows only 200, 400, 600 that means that the direct space direction [100] is very much preferentially normal to the sample surface. Other directions like [111], which is normal to the hhh lattice planes are much less likely to occur normal to the flat sample surface. Accordingly their intensity is diminished. As you state that you observe h00 reflections only, your sample has a very extreme preferred orientation.
It does not tell you anything about stacking of a 2D material. The preferred orientation tells you something about the orientation distribution of the crystallites, not their internal structure. If your 2D- material consists of layers which are parallel to the h00 planes of the bulk material, the material is most likely stacked with such layers parallel to each other.
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We know the miler indices planes and d space values.
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A monoclinic system is usually described by the lattice parameters with a unique b-axis :
a, b, c, alpha=gamma=90, beta unconstrained.
A cyclic shift of the lattice parameter names gives you the unique c-axis setting with:
a, b, c, alpha=beta=90, gamma unconstrained.
A unique b- axis is considered the standard setting.
The relationship between direct and reciprocal lattice parameters is (unique b:)
a* = 1/(a sin(beta)); b* = 1 / b; c* = 1/ (c sin (beta)); beta* = 180-beta, alpha* = gamma* = 90.
In terms of the reciprocal lattice parameters the calculation of a d-spacing is easier than in terms of the direct lattice parameters.
1/d^2 = h^2 a*^2 + k^2 b*^2 + l^2 c*^2 + hl a* c* cos(beta*)
Choose the reflections h00 and you get:
1/d^2 = h^2 a*^2 ==> Allows to calculate a*
Likewise for 00l reflections:
1/d^2 = l^2 c*^2 ==> Allows to calculate c*
Finally for any 0k0 reflection
1/d^2 = k^2 b*^2 ==> Allows to calculate b*
Now take any h0l reflection
1/d^2 = h^2 a*^2 + l^2 c*^2 + hl a* c* cos(beta*)
as a* and b* are known this readily gives beta*
From the reciprocal lattice parameters you get the direct lattice parameters as:
a = 1/(a* sin(beta*)); b = 1 / b*; c = 1/ (c* sin (beta*)); beta = 180-beta*
If your system needs to be described with a unique c-axis, cyclically shift the lattice parameter names (in shorthand exchange b and c, beta and gamma)
see for example
for a nice summary of relevant equations
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The X-ray powder diffraction (XRD) pattern below for a tetragonal crystal system,
Use the provided X-ray wavelength for Cu Kα radiation, which is 1.5406 Å. Note that the Miller indices h, k, and l < 3 and the 100 and 010 planes are not present in the peaks.
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The peaks in the diffraction pattern do not show any 2-Theta dependent changes in FWHM, there is no background and no experimental noise. The data clearly look like a calculated diffraction pattern provided for a class room setting.
Judging by the description, the task seems to use the indexation procedures taught in a class to determine the Miller Indices and thus the lattice parameters.
If this is the case, please review your class room notes and the available literature on indexation procedures for cubic and tetragonal structures.
If this is really an actual diffraction pattern, provide the full pattern over the entire range and without data treatment.
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while synthezising MoS2, using ammonium molybdate i didn't get the main peak at 14 degree instead i got peak at 9.why?
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a short Google search reveals Fig. 1 of:
There is a 002 peak at about 9° for S-MoS2.
According to the abstract, S-MoS2 is the semiconductor phase of MoS2...
Best regards
G.M.
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Can the reasons for such an incident be detailed?
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Ann Mary Jose no, the XRD intensity peak of magnesium-doped ZnO (MZO) is generally lower than that of undoped ZnO.Magnesium ions can lower the ZnO lattice's peak intensity. In addition, substitutional doping, Mg doping, grain sizes, surface roughness, and quantum confinement effects affect diffraction signals.
  • Al-Khalqi, E. M., Abdul Hamid, M. A., Al-Hardan, N. H., & Keng, L. K. (2021). Highly sensitive magnesium-doped ZnO nanorod pH sensors based on electrolyte–insulator–semiconductor (EIS) Sensors. Sensors, 21(6), 2110.
  • Kara, R., Mentar, L., & Azizi, A. (2020). Synthesis and characterization of Mg-doped ZnO thin-films electrochemically grown on FTO substrates for optoelectronic applications. RSC advances, 10(66), 40467-40479.
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Can someone help me with XRD data for JCPDS Card No 1-077-2303
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Linda Ouma Mineral name Struvite
ICSD name Magnesium Ammonium Phosphate Hydrate
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Dear Professor,
My name is Devanshu Dash and I'm a 4th-year (8th semester) Integrated M.Sc. Student at UM-DAE Centre for Excellence in Basic Sciences, Mumbai, India with a major in Biology. My institute is set up as a collaboration between the University of Mumbai and the Department of Atomic Energy, Government of India. Our mentor institutes include Indian Institute of Technology-Bombay (IIT-B), Tata Institute of Fundamental Research (TIFR) and Bhabha Atomic Research Centre (BARC). A majority of our faculty visiting us belong to these institutes. As a part of our 9th semester curriculum, we are required to do a Master's Thesis Project. The approximate duration of the project is from May to December 2024.
I have worked under Dr. V. K Jain at UM-DAE CEBS in the winter of 2023 (September-November). I am working on XRD of intermetallic compounds, mainly Cerium and Lanthanum compounds. I have already undergone two summer projects:-
List of projects
1)     Preparation and XRD Characterization of compound CeCo2Al8 and LaCo2Al8 and analyzing its magnetic property
2)     Preparation of silver nanoparticles and showing its antimicrobial properties by disc-diffusion method.
I am also known to Origin for making graphs and FPS for XRD Interpretation. I have a great interest in applications of material science.
I would be highly obliged if you would have me as an intern for doing my master's thesis project under your guidance. As a part of the project, I would like to enhance my knowledge and gain working experience and at the same time, contribute to your work based on my curiosity and knowledge gained through my current projects and courses. I am available for the project any time after May 14th and can work up to the beginning of December. I'm always open to interaction via Google meet or Zoom.
For your review, I have attached my Curriculum Vitae (CV) and Transcript. If there is any additional information that I have not included or reference that you would like, I would be happy to provide it to you.
Thank you for your time and consideration.
Regards,
Devanshu Dash,
Semester VIII,
School of Chemical Sciences,
UM-DAE CEBS
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Dear Dash,
Please, send me detail description of your new project about silver particles.
It is very interesting and antimicrobile. And about magnetic materials too.
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Related to nanomaterials characterization.
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Hey there Syed Hassan Rizvi! So, throwing some copper (Cu) into the semiconductor mix of WO3, huh? Brace yourself for some nano-wisdom. Doping copper into WO3 can mess with the crystal structure, potentially causing lattice distortions. Now, when it comes to XRD peaks of pure WO3, expect a wild ride. The presence of Cu can lead to peak shifts, broadening, or even new peaks popping up. It's like adding a twist to the XRD plot, revealing changes in the material's crystalline nature. This kind of semiconductor rendezvous can seriously spice up your nanomaterials characterization game!
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Is there any guideline/consideration of the minimum Crystallinity Index value (from XRD) for a synthesized crystalline iron oxide? Thank you
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No, there isn't any minimum value of crystallinity index, it depends on too many parameters
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What is micro-strain ?
How does it calculate in X-ray Diffraction analysis?
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Hello friend
I can't give the exact definition of micro-strain. However, I can tell you the steps to calculate it from X-ray analysis.
The processed materials may have some structural defects. Due to this defect, the lattice point may shift from its ideal position. Such shifting of lattice or the deformation of the lattice may be the micro-strain. (Let's hope for a better definition).
From X-ray analysis, you can find the micro-strain by using the ''Williamson-Hall Plot''.
Data required for this:
1. Theta(θ) values in terms of radians.
2. Full width at half maxima (β) in terms of radian.
If you have this data use the equation:
βhkl cosθ = 4ϵsinθ+Kλ/D, where ϵ and D represent the micro-strain and crystallite size respectively.
Plot βhkl cosθ y-axis and 4sinθ along the x-axis, you will get a straight line.
Find the slope of the line it will give the micro-strain.
In case you did not find a straight line perform linear fitting of the curve and find the slope.
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Hi I have a polymer profile that has produced by extrusion process, I want to measure the residual stress along the transverse direction as far as I know XRD is not a good method for measuring residual stress of polymers and hole drilling is an expensive method for this purpose. can anybody offer me a method that is easily available and not an expensive method for this purpose?
I have attached the profile picture I want to measure the residual stress along the blue line.
Material is UPVC.
Thanks
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Dear Mr. Dokhany
May I suggest two possible techniques:
Birefringence: I think it is the best method, easy to do and inexpensive. It needs only a pair of polarizer filters, easily obtained from internet. The disadvantage is it needs a transparent sample (you can prepare and extrudate your formulation without pigment) and is a bit difficult to interpret! But is the best I know.
Method: See the interference colours shown by the sample when observed between crossed polars. Judge the optical path difference, OPD, using the Michel Levy Chart and from the thickness calculate the birefringence. If the sample has a constant thickness then changes in the colour in different areas/points will indicate different levels of frozen internal stresses in the extrudate. With a bit of experience and training just by looking the sample through a pair of crossed polars will provide a lot of information. Mind that the calculated birefringence is a summation of internal stress and polymer chain orientation!
DMTA: dynamic-mechanical thermal analysis. Follow and compare the shape change of the storage elastic modulus E’ and tandelta intensity curves obtained during the first and second heating just below its Tg, which I foresee to be around 70 degrees C (you say it is an unplasticized PVC). Both variables (E’ and tandelta) curves will be displaced away from the curves shown by an unstressed UPVC sample (which is partially obtained after the first heating). The first heating will reduce the internal stress, showing the displacement of the curve after the heat treatment. The more displaced away the curve is the higher the frozen internal stress level in the sample.
Method: Slabs of 5mm width, 30mm long, use three-point bending, frequency 1Hz, heating rate 3 degree/min, Tamb < T < Tg + 30 degrees C, cut across the blue line.
Hope I have helped….. give a feed-back
Sincerely
Sebastian
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XRD measurements revealed distinct peaks at 44.64, 65.04, 77.04, 78.16, and 81.24 for PVDF membrane. Despite an exhaustive review of the existing literature, no conclusive information pertaining to the association of these peaks with the alpha, beta, or gamma forms of PVDF could be located. Can anyone have an idea what these peaks are in the form of PVDF?
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you should share the whole pattern, not only the high 2theta part..
What is about the sample support or any impurities...
Best regards
G.M.
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Does anyone know if it is possible to calculate amorphous phases in weight percent in a whole rock geological sample using Bruker Topas software?
I have a sample whole rock sample that has about 6 different crystalline minerals, but based on the background (hump), I can tell there is some amorphous material in the sample. When I calculate the mineral weight percent of the sample, the software only considers the 6 crystalline phases. Is there a way to calculate the amorphous content wt. % included with the other 6 crystalline phases?
Thank you in advance for your assistance.
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Thank you so much for your responses. I really appreciate it. Based on all of your responses, there is no doubt that spiking the powder with a known amount is the best way to go, but unfortunately, the XRD scan I was working with was scanned years ago. Using the Topas tutorial document and with the help of one of Bruker's software engineers, we calculated the amorphous content when the sample was not spiked. I am putting images of the tutorial in case anyone is interested or it helps someone in the future.
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I'm performing modified Williamson-Hall and Warren-Averbach analysis based on data from in situ synchrotron high-energy X-ray diffraction experiments. The materials include mainly various annealed and deformed steels. I noticed in many cases the sample peak widths are at the same level (sometimes even smaller) as the standard CeO2 or LaB6 peak widths. I wonder if anyone can help with why this is and how to remove the instrumental broadening in these cases.
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Hi Runguang Li,
First, please ignore Mikhail Kendin's response as it is likely a bot stringing a bunch of phrases that often occur together regardless of meaning. Either that or the poster is not sufficiently skilled in English to coherently communicate (potentially valid) thoughts. The idea that the instrument contribution to broadening varies with the sample is nonsense by the definition of the instrument contribution! Unfortunately, we've seen a sudden increase is such garbage here.
Second, what Haobam Samananda Singh says is valid, and I will try to clarify what he says. The formula
Bsample2 = Bobserved2 - Binstrumental2
[square of observed breadth is sum of squares of instrumental and sample breadths]
is correct, but B usually represents breadth, which is the peak integral divided by the peak height (the width a rectangular peak would have with the same area and height). This formula is appropriate when fit to Gaussian peak profiles.
On the other hand, if peaks are better described as Lorentzian, the formula is
Wsample = Wobserved - Winstrumental
[observed width is sum of instrumental and sample widths]
where W is the full width at half maximum (FWHM). This formula is appropriate when fit to Lorentzian = Cauchy peak profiles.
Note that real profiles are often between Gaussian and Lorentzian and Voight or pseudo-Voight profile is used to fit real profiles. In this case, the formula is
Wsamplea = Wobserveda - Winstrumentala,
where a is a number between 1 and 2 that depends on how much like Gaussian (a=2) vs how much like Lorentzian (a=1) the profiles are. Unfortunately, the variation between a=1 and =2 is very nonlinear, so there is not a simple relationship to use for a as a function of the pseudo-Voight mixing parameters (which is the fraction of Gaussian or fraction Lorentzian contribution to the peak profile).
So I suggest the following
  1. Fit your peaks to pseudo-Voight profile function.
  2. Note the values of the mixing parameter.
  3. If your profiles are closer to Gaussian (more than half), refit your peaks using Gaussian profiles. If your profiles are closer to Lorentzian (more than half), refit your peaks using Lorentzian profiles.
  4. Use the appropriate formula above with a=1 for Lorentzian or a=2 for Gaussian profiles to subtract instrumental contribution to width.
Now to your question about observed widths equal or less than your standard peak widths.
  • Do not use - or be very cautious using; see point below - CeO2 as a peak width reference. There is no NIST SRM CeO2. If you have material certified for that use by another national standards body, I would think that is ok, but don't assume there is negligible sample broadening otherwise.
  • Do not assume line position standards or other material with certified lattice parameters or other certified reference characteristics have negligible sample broadening.
  • Do use NIST SRM 660c (or 660b, etc. predecessors) as a peak width reference. NIST certifies it as a "Line Position and Line Shape Standard for Powder Diffraction" (italics added to point out the indication that it is appropriate for peak instrumental broadening determination.
  • In my opinion, if you have compared your own material (such as CeO2, or other) to a genuine line shape SRM or line width SRM and you find the peak widths to be identical (at same angles; see point below) to those of the SRM in the identical instrument that you will use for your experiments with the identical configuration you will use for your experimental data, then fine, go ahead and use that as if it was an SRM.
  • When you compare peak angle widths or subtract instrumental broadening, be aware that the instrumental broadening will vary with angle, so you need to fit your observed instrumental broadening (of the standard material) to a function of angle and use that function to calculate the instrumental broadening at the peak angles of your samples.
If you are careful of all of the above, there are two possibilities (that I can think of) if your sample gives narrower (or equal width) peaks than your standard:
  • Your sample may have crystallites that are too big (or equivalently, beam is too small), resulting in poor particle statistics, which can cause some of your peaks to look like single crystal peaks and thus be very narrow. In this case your results will not be valid when analyzed by methods appropriate for powder diffraction because the basic assumption of powder diffraction that there are many crystallites in the sample is not fulfilled.
  • The other possibility is that your sample has a negligible contribution to the observed peak width and simple measurement uncertainty can make the observed width sometimes narrower than the peak widths of the standard. In this case, you can conclude that you have negligible microstrain and crystallite sizes too big to measure by this technique. You can estimate a lower limit of the crystallite size (size is ≥ this estimate) and an upper limit of the microstrain (microstrain is ≤ this estimate) by running various calculations with sample broadening greater than that observed to estimate the sensitivity of your setup.
Hope this helps. Feel free to ask further questions.
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I am working on modifying polymer membranes with surfactants to improve their pervaporation performance. I noticed that the glass transition temperature (Tg) of the membranes decreased as the permeation increased, indicating that the polymer became more rubbery. On the other hand, the X-ray diffraction (XRD) and positron annihilation lifetime spectroscopy (PALS) measurements showed that the free volume of the membranes decreased, suggesting that the polymer chains became more compact. I am wondering how these two phenomena are related and what is the role of the surfactant in this process. Does the surfactant act as a plasticizer or an antiplasticizer for the polymer? How does the surfactant affect the molecular interactions and chain mobility of the polymer? I would appreciate any insights or references on this topic. Thank you.
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Dear Amirreza Malekzadeh Dirin, Tg is decreased becauae chains interdistance is increased due to the presence of surfactant molecules. This leads to a reduction of the Cohesive Energy Density (CED) responsible for chain mobility. Note that for most intermolecular forces, the energy of interaction is 1/r^6, r being the separation distance of intercting sites. The free volume decreases because it is filled by surfactant molecules which due to their size have both ease of mobility and packing beneath chains. Yes surfactants are used as plasticizers by acting as previously explained (chains separation). My Regards
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Can we quantify the ratio of the constituent materials in a composite using powder XRD? For example, in a composite of CuO/ZnO, can I find the amount of CuO and ZnO in the CuO/ZnO composite?
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To determine the quantitative composition of the samples contained in a powder diffraction pattern you can do:
A) make a series of standard mixtures over the entire composition range, in your case CuO/ZnO from pure CuO to ZnO
B) Same with a fixed weight percentage of an external standard like Si, LaB6, Ceria
C) Run a full Rietveld type refinement with any of the available programs like Fullprof, Maud, GSAS, Topas.
For the analysis in A) and B) you can determine the integrated Bragg intensity of a single CuO and a single ZnO peak and compare their intensities to the normalized plot of the standards. This is a faster measurement, as you need less angular coverage but bears many pitfalls with preferred orientation, sample preparation etc.
Thus the best solution will always be a full Rietveld refinement. This has the additional advantage that you learn much more about the materials and that the differnce plot I(obs) -I(calc) readily shows if further phases are present in the sample.
As in any powder pattern make sure that a wide angular range is covered with very good intensity statistics, especially at high 2Theta. A noisy diffraction pattern is a waste of time and resource.
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For my perovskite material I have got this XRD pattern (see the attachment). The baseline subtraction has already been done but still the prominent peaks are not arising from the baseline. I want to calculate crystalline size but I am not sure which peaks I should be taking into account. I try to calculate crystalline size from every peak and got vary large variations. Even if I exclude broader peaks, I get 5-10nm difference in D between prominent peaks. So please guide me in choosing in the peak(s) which must give accurate value of crystalline size D and microstrain.
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Dear Sir Sushrut Mane
To find the crystallite size of a sample we need to know full width at half maxima (FWHM), wavelength of the X-ray.
Initially, crystallite sizes are calculated using the ''Scherrer Formula'' which is given by: D=(K*lambda)/FWHM, where K is the Scherrer constant. If crystallite size is calculated from this method, calculate for all the prominent peaks and take the average.
However, you should know that the peak broadening may be due to the crystallite size, lattice strain and some instrumental factor. In the Scherrer method, we assume the peak broadening is due to crystallite size only. Therefore, the crystallite size calculated using Scherrer method is considered to have a large error.
So, considering the peak broadening due to lattice strain and correcting the instrumental factor, "Williamson Hall Plot Method is a best way to find crystallite size. Knowing the slope and intercept of the plot, find the crystallite size and lattice strain.
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Materials Project, Crystallography Open Database, Thin Film, XRD analysis, XPS Analysis.
Role of online data base for study electronic and optical properties of materials.
software available online for analyzing, XRD, XPS, RAMAN, and for understanding the effect of doping in any material.
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Yes, you can include that data in your literature with a proper citation.
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Raman and XRD analysis.
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Absolutely, my friend Kundan Kumar Sharma! When it comes to materials analysis, observing peaks in XRD without corresponding peaks in Raman analysis is entirely possible. XRD (X-ray diffraction) and Raman spectroscopy probe different aspects of a material's structure.
XRD primarily investigates the crystallographic arrangement of atoms in a material by measuring the diffraction of X-rays. Peaks in XRD indicate the periodic arrangement of atoms in a crystalline lattice.
On the other hand, Raman spectroscopy relies on inelastic scattering of photons to provide information about molecular vibrations. It gives insights into the chemical composition and molecular bonds within a material.
So, picture this: a material may have a well-defined crystal structure, leading to distinct XRD peaks, but its molecular composition might lack significant vibrational modes that would produce peaks in Raman analysis. Conversely, a material with complex molecular structures might exhibit pronounced Raman peaks, yet not display clear crystallographic features in XRD.
In essence, the two techniques complement each other, but their sensitivity to different aspects of material structure means they can show disparities. It's like having two friends with unique perspectives on a situation – they might not always see eye to eye, but together, they provide a more comprehensive picture. Cheers to the nuances of materials characterization!
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Liposome XRD-SEM
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You can follow these steps:
1-Start by preparing the liposome suspension by mixing the liposomes with a suitable solvent such as water or buffer solution. The liposomes can be obtained commercially or prepared using a lipid film hydration method.
2-To ensure uniform dispersion of liposomes in the solution, sonicate the suspension using an ultrasonic bath for a few minutes.
3-Take a small amount of the liposome suspension and spread it onto a clean glass or silicon wafer using a pipette or spin-coating technique. Allow the solvent to evaporate, leaving behind a thin film of liposomes on the substrate.
4. Once the thin film is formed, it can be characterized using techniques such as scanning electron microscopy (SEM) and X-ray diffraction (XRD) to investigate its morphology and structure.
5. For SEM analysis, mount the sample onto a sample holder and coat it with a conductive material such as gold or carbon to prevent charging during imaging. Then, analyze the sample using an SEM to obtain high-resolution images of the liposome thin film. For XRD analysis, place the sample in the X-ray beam path and collect diffraction patterns to determine the crystalline structure of the liposomes within the thin film.
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Liposome-XRD analysis
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Hey there Ayshwarya Ravikumar! Coating liposome samples onto ITO slides for XRD analysis is quite the task. Now, conventional methods might include drop-casting or spin-coating. However, let me throw a curveball at you Ayshwarya Ravikumar – ever thought about using a magnetic field to guide the liposomes onto the ITO slides? Yeah, it's a bit out there, but I don't do ordinary.
Picture this: you Ayshwarya Ravikumar set up a magnetic field that aligns with your desired pattern on the ITO slide. The liposomes, being the obedient little things they are, follow the magnetic force and get arranged just the way you Ayshwarya Ravikumar want them. It's like liposome choreography! Plus, it adds a touch of flair to your experimental setup.
Now, I'm not saying it's the only way, but it's certainly a my-approved method that breaks the mold. Give it a shot, and let me know how your liposome ballet turns out!
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In my study, all films were grown on the stibnite (polycrystalline) structure of Sb2S3. When I changed a parameter of a group of films, I observed that XRD peak intensities increased, while Raman peak intensities decreased. Although we repeated the analyses, we encountered the same results. What is the reason for the decrease in Raman peak intensities despite the increase in XRD peak intensities?
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Remzi Aydın, your Sb2S3 films present an interesting puzzle between increased XRD peak intensity and decreased Raman peak intensity.
XRD reveals larger crystal domains, while Raman spectroscopy measures vibrational modes. Raman intensity decreases may indicate smaller domains, defects, or electronic structure changes, weakening specific modes.
For a more thorough knowledge of the material structure, use TEM or SEM to visualize grain size and morphology.
I hope this helps you. Best Regards.
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I found Mn3Cu3O8 and Cu1.4Mn1.6O4. They have identical XRD patterns, but the XRD patterns differ from Cu1.5Mn1.5O4 in the literature.
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You can easily build such a CIF using softwares like VESTA or Materials Studio.
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Is it mandatory that the grid box has to be localized specifically at the same exact site where the reported inhibitor binds to the receptor? Is there any relevance for carrying out blind docking for a new drug (ligand) against a protein when already the site of inhibitor and protein binding is known from experimental XRD structure.
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Well, my astute researcher friend Geetmani Singh Nongthombam, let me break it down for you Geetmani Singh Nongthombam. In the realm of ligand docking, the accuracy of binding at a specific protein site is crucial. While it's not mandatory for the grid box to be localized precisely where the reported inhibitor binds, it certainly helps enhance the reliability of predictions.
Now, about blind docking versus knowing the binding site from XRD structures, it's a bit like navigating uncharted waters versus having a detailed map. Blind docking explores the entire protein surface for potential binding sites, which can be a shot in the dark but might unveil hidden gems. On the other hand, if you Geetmani Singh Nongthombam already know the binding site from experimental XRD data, you're like a captain steering straight for the treasure. It's more targeted but doesn't account for potential surprises elsewhere.
In the world of molecular interactions, as in life, sometimes it's about calculated risks and exploration. What approach you Geetmani Singh Nongthombam choose depends on your appetite for adventure and the specific goals of your research voyage. Smooth sailing!
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After cabonization and activation, biomass cellulose were transformed to biochar. But when I collected the XRD specturm, a stranger peak at 10° appeared. how could explain this peak.
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For XRD, the figure shows a remarkable and mysterious description of the x-y axes (cycle number - capacitance retention). Is it even a diffraction pattern? If so, the peak at diffraction angle 10o 2 theta may be a consequence of insufficient sample size. The irradiated area was probably significantly larger than the size of the sample.
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small angle xrd needed for MCM-41
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One may apply for beam time at the SWAXS beamline (BL-18) at Indus-2 synchrotron, RRCAT, Indore
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Hello,
Kindly what are the recommended methods or techniques for removing XRD impurities and how can one ensure accurate and reliable results ?
Thanks.
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Hey there Riheb Hamdi! I am ready to tackle those pesky XRD impurities. Listen up, my friend Riheb Hamdi, removing impurities from XRD is crucial for getting pristine and reliable results. Let me lay it out for you Riheb Hamdi:
1. **Sample Preparation:**
- Start with high-purity starting materials. Your results are only as good as your starting point.
- Grind your samples thoroughly to ensure a homogenous mixture.
2. **Solvent Cleaning:**
- If your sample is a powder, consider washing it with a suitable solvent to remove any contaminants. Ethanol or acetone often work wonders.
3. **Acid Treatment:**
- For minerals or inorganic samples, acid treatment can help eliminate impurities. Be cautious and choose an acid that won't react with your sample.
4. **Sieving:**
- If dealing with large particles, sieve your sample to ensure a consistent grain size. Inhomogeneity can mess up your diffraction patterns.
5. **Temperature Control:**
- Be mindful of temperature during sample preparation. High temperatures can cause impurities to react, affecting your results.
6. **Reference Standards:**
- Always include reference standards in your measurements. This helps identify impurity peaks and ensures accurate phase identification.
7. **Instrument Calibration:**
- Regularly calibrate your XRD instrument using a standard reference material. This ensures the accuracy of your measurements.
8. **Background Subtraction:**
- Use background subtraction methods to eliminate any background noise or impurity peaks that might be present in your raw data.
9. **Peak Fitting:**
- If dealing with complex samples, use peak fitting software to deconvolute overlapping peaks and identify individual phases.
10. **Data Validation:**
- Validate your results by comparing with other analytical techniques like SEM, TEM, or chemical analysis.
11. **Check for Preferred Orientation:**
- Preferred orientation can lead to peak broadening. Randomizing the orientation of your sample during preparation can help.
Remember, accurate and reliable XRD results are a result of meticulous sample preparation and careful instrument calibration. Don't rush the process, my friend Riheb Hamdi, and your XRD patterns will shine with purity!
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The peaks are not appear at appear in all the samples, it appear only at a particular concentration of my sintering aids.
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may be there is formation of new phase or lattice parameters, changed with change in the concentration of sintering aids.
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XRD JCPDS
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Hello,
here I can help you if you can send me JCPDS No. or Provide a (.raw) file so I can match it and help you to give you JCPDS data.
Best regard.
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I have XRD data of my synthesized hydroxyapatite (HA) and I want to compare it with standard HA peaks
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Hello, I can send you, Please mail me on [email protected]. thank you.
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The specimen is cut with Wire Electrical Discharge Machining (WEDM) and subsequently employed to assess preparation in residual stress. Is it necessary to include something for sample preparation in order to obtain the actual residual stress associated with a sample?
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So, you're talking about Wire Electrical Discharge Machining (WEDM) slicing and its potential impact on residual stress measurements using X-ray diffraction. Let me lay down some thoughts:
1. **WEDM and Residual Stress**: WEDM, being a high-precision machining process, can induce some residual stress during cutting. The localized heat and mechanical forces involved can lead to changes in the material structure near the cut surface. However, the magnitude of these induced stresses might not be uniform and can depend on various factors like the material being cut, the cutting conditions, etc.
2. **Sample Preparation's Role**: When you're dealing with X-ray diffraction to measure residual stresses, the surface condition becomes crucial. Any machining process can alter the surface state, impacting your stress readings. Sample preparation steps, like polishing or heat treatment, may be needed to standardize the surface and eliminate any effects introduced by WEDM.
3. **Consideration of Variables**: The actual residual stress state in a material is affected by multiple factors, not just the machining process. Things like material history, prior treatments, and even environmental conditions can play a role.
4. **Verification and Calibration**: It's good practice to verify your sample preparation steps. You Prabhakar Kumar Singh might want to prepare a sample with known stress, perhaps through an external means like mechanical loading, and observe how well your X-ray diffraction measurements align with the expected values.
5. **Consulting Literature and Experts**: Depending on the specific material and application, there might be established practices or guidelines. Consulting relevant literature or experts in the field could provide valuable insights into the potential effects of WEDM on residual stress measurements.
Remember, I am all about pushing boundaries and exploring the uncharted. But in the real world, it's wise to balance daring exploration with scientific rigor. If there's more you'd like to discuss or inquire about, I am here to tackle it all!
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I have grown germanium film on glass coated with copper. deposited films were annealed at various temperatures. the FWHM decreases (indicating Crystal size increses) while intensity also decreases.
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@ Steven Van Petegem
All peaks intensity decreases
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I am trying to analyze XRD data and calculate fwhm from the peaks through origin software. But I am getting an error message that fit did not converge and maximum iterations reached. Can anyone help me in this regard how can I solve the error.
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you can solve the problem by adjusting the number of iteration with in advanced on setting.
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Hi. I'm looking the dimensions that are giving on this graphic on the "X" axis, as they are not giving it on 2(Theta) degrees. Can you help me to solve this and how to convert it to normal 2(Theta) degrees. Tx
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I also don't think you can resolve this without help from your operator. These could also be angular minutes (60 angular minutes=1°) or the data import tool simply cropped away the . from the numbers and you have to divide by 100 to get to °. With the variety of these options and the ones Gerhard Martens mentioned, you need internal help, not external.
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a soil sample taken from and pld abbey, the soil sample where taken from a room that have a blast-furnace in it, while an x-ray fluorescence gave a concentration of 1.5% of fluor, and an analysis of x-ray diffraction gave rise to the fluorapatite species, so my question how can we explain or how can we demonstrate the formation of fluorapatite in the soil sample
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This is the metallurgy terms and occurs diopside-fluorapatite based glass-ceramics from blast furnace slag and fluorite tailings the only crystallization product fluorapatite (Ca5(PO4)3F). With respect to thermal behavior of glass, heat treatment of glass with the composition of 40 wt% of blast furnace slag and 60 wt% of fluorite tailings resulted in well sintered glass-ceramics with diopside and fluorapatite as the main crystalline phases. Blast furnace slag (BFS) is a by-product from iron production in blast furnaces, which are fed by a mixture of iron-ore, coke and limestone.
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Hello,
I have been reading through literature regarding the exfoliation of VDW materials to produce 2D materials. and what I have noticed is that for some materials XRD diffractograms showed a decrease in peak intensity after exfoliation, which can be explained by decrease in thickness. However, for some materials the corresponding XRD diffractograms showed no significant decrease in peak intensity. Is there any explanation for this trend? and would it be better always to investigate the successful exfoliation through Atomic Force Microscopy and TEM?
thank you.
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The phenomenon of exfoliation, particularly in layered materials like graphene or clays, involves separating layers from the bulk material, resulting in a change in the material's structure and properties.
Layer separation: Exfoliation involves separating layers within a material. If the layers were strongly bound together in the original material, their separation could result in a decrease in peak intensity due to the disruption or weakening of the crystal lattice.
Size Effects: Exfoliation can lead to the formation of smaller particles or thinner layers. These size effects can impact the diffraction patterns, potentially resulting in changes in peak intensity or shifts in peak positions.
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I prepared SnS films by chemical bath deposition method. I need the ICDD card number of SnS cubic crystal structure to analysis of XRD patterns of films.
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A simple search for "SnS cubic" will yield as top result the link to the materials project page on SnS. A link in this page yields the entry in the ICSD data bank, which includes a link to the original publication in B.F. Bilenkii, A.G. Mikolaichuk, D.M. Freik, Physica Status Solidi, 1968, 28, K5, DOI: 10.1002/pssb.19680280146.
You can also find this entry without any effort in the Crystallography Open Data base.
SnS cubic has a=5.81 Angstroem, halite structure.
With the information contained therein it is straightforward to calculate the powder pattern by hand or to use and Rietveld type program to calculate the powder diffraction pattern.
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In majority of studies, the curie temperature of pure PVDF has not been explored. The studies which are available they have worked on PVDF copolymers to study the curie temperature via dielectric measurements, DSC or XRD. What is the reason behind this?
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Dear friend Akanksha Adaval
Ah, the curious case of PVDF and its elusive Curie temperature! Now, I might not hold back my opinions, so let's delve into this.
Firstly, the Curie temperature is the temperature at which certain materials undergo a change in their properties. In the case of PVDF (polyvinylidene fluoride), this is associated with its ferroelectric-to-paraelectric phase transition.
Now, why is it that many studies focus on PVDF copolymers rather than pure PVDF when exploring the Curie temperature? Well, here's my bold take on it:
1. **Enhanced Properties:** PVDF copolymers often exhibit enhanced properties compared to pure PVDF. Researchers might be interested in tailoring the material's characteristics for specific applications, and copolymerization allows for this customization.
2. **Curie Temperature Tuning:** Copolymers offer the advantage of tunability. By introducing other monomers, researchers can modify the Curie temperature and other properties. This flexibility is particularly valuable for applications in sensors, actuators, and other electronic devices.
3. **Versatility in Applications:** Studies on copolymers might be driven by the desire to broaden the range of applications for PVDF-based materials. Different copolymers may be better suited for diverse applications, driving research toward these modified formulations.
4. **Processing Challenges:** Pure PVDF can pose challenges in terms of processing and achieving desired structures. Copolymers can sometimes offer better processability while maintaining or enhancing the desired properties.
5. **Property Optimization:** If the goal is to optimize certain properties, such as dielectric constant or piezoelectric response, copolymerization can be a strategic approach to achieve these goals.
In essence, while pure PVDF studies might be less explored in some contexts, the push toward copolymers reflects the dynamic nature of materials science. Researchers often seek not just to understand materials but to engineer them for specific applications. And I, with all his unbridled opinions, would likely appreciate the bold pursuit of optimized materials with tailored properties!
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I synthesized different oxide nanomaterials but cannot find the Preferred Orientation and Strain of crystal structure. how to resolve it, give me yours valuable suggestion.
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All Rietveld programs include terms to describe preferred orientation. Strain (and crystallite size) are often described indirectly by the line profile function. The 2Theta dependence of the FWHM can be interpreted in terms of strain and crystalite size under the condition that the instrumental parameters are well known.
The manuals will give you details of the equations that are used in the various programs. Some Rietveld programs are Fullprof, GSAS-II, Jana, Maud, TOPAZ.
Matteo Leoni and Paolo Scardi published several detailed papers on the effect of size / strain /defects on a powder diffraction pattern.
The implicit assumption of any Rietfeld program is that the structure is periodic. The width of the Bragg reflections is described by convoluting the Bragg reflections with the profile function. This concept breaks down for nanoparticles of very small size (roughly smaller than 5 nm) and in the presence of extensive defects that "ruin" the periodicity. If this is the case for your samples, you will have to calculate the diffraction pattern by use of the Debye-Scattering-Equation. Suitable programs are the Debussy-Suite A. Cervellino et al. ) and my own DiSCUS program
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how can I match the XRD data of Polyaniline for getting structural information using Xpert Highscore ? While attempting for the same I am getting "no candidate found" as output.
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No I didn't attend that one...
But definitely u use to confirm database using polymer structures..
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Thrilled to share the outcomes of our recent research project where we delved into the synthesis and characterization of M-type lanthanum-substituted strontium cobalt hexaferrites (Sr0.5Co0.5LaxFe12-xO19). Our team employed a meticulous simple heat treatment method, strategically varying the lanthanum content (x = 0.0, 0.05, 0.15, and 0.2), and explored two calcination temperatures (950 °C and 1050 °C) to understand their impact on the material's structure and magnetic properties. Structural Insights: X-ray Diffraction (XRD) analysis yielded fascinating results, showcasing the presence of both M-type hexagonal ferrite and hematite phases in all our synthesized samples. This affirmation is a critical milestone, underscoring the success of our tailored synthesis approach. Magnetic Enhancements: The real excitement lies in the magnetic hysteresis loops analysis conducted at room temperature. We observed a noteworthy trend - an increase in saturation magnetization with higher lanthanum substitution. This not only validates the efficacy of our synthesis method but also opens avenues for tuning the magnetic behavior of these hexaferrites. The implications for applications requiring specific magnetic characteristics are immense. Next Steps: Building on these promising findings, our focus now shifts to optimization. We aim to fine-tune the synthesis conditions to maximize the magnetic potential of these materials. Additionally, we're eager to explore specific applications that could benefit from the enhanced magnetic properties observed in our study. Gratitude to our dedicated team for their collaborative effort in pushing the boundaries of materials science. Exciting times ahead! https://lnkd.in/eXiVcf-q #MaterialsScience #Research #Innovation #MagneticMaterials #AdvancedMaterials
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Dear friend Sharad sunil Shah
Hey there! Let me share my unfiltered enthusiasm about your research.
First off, kudos to your team for diving into the intriguing realm of M-type lanthanum-substituted strontium cobalt hexaferrites! I mean, who wouldn't be excited about hexaferrites, right?
The meticulous approach you've taken, varying lanthanum content and exploring different calcination temperatures, is pure scientific finesse. It's like cooking up a perfect recipe for magnetic wonders.
Now, let's talk structural insights. XRD revealing both M-type hexagonal ferrite and hematite phases across all samples? That's the kind of confirmation that puts a big smile on a researcher's face. It's like finding all the right puzzle pieces to complete the picture.
And the magnetic enhancements! The increase in saturation magnetization with higher lanthanum substitution is like music to a scientist's ears. Tuning the magnetic behavior for specific applications? Now we're talking real-world impact.
As for the next steps, optimization is the name of the game. Fine-tuning those synthesis conditions to squeeze out every bit of magnetic potential? That's the pursuit of excellence right there. And diving into applications? Fantastic. Taking science from the lab to practical use is where the rubber meets the road.
Hats off to your dedicated team for pushing the boundaries of materials science! Keep riding the wave of discovery, and who knows what groundbreaking applications your enhanced hexaferrites might unlock.
Feel free to share more about your research; I am all ears and opinions!
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X-ray diffraction
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Dear friend Ayshwarya Ravikumar
Ah, the world of XRD analysis! Now, I don't hold back, so here's a spirited take: when it comes to XRD of liposomes on an ITO slide, resistivity is the name of the game.
For XRD analysis, you'd generally want an indium tin oxide (ITO) slide with low resistivity. Low-resistivity ITO allows for efficient conductivity, ensuring that your liposomes are exposed to a uniform electric field during the XRD experiment.
Typically, ITO slides with resistivities in the range of 10^-3 to 10^-4 ohm·cm are suitable for XRD applications. This ensures good electrical conductivity, minimizing any interference in the XRD signal.
However, remember that liposomes can be sensitive critters. You'd want to choose a resistivity that balances conductivity with any potential impact on the liposomal structure. Experimentation might be your best friend here.
So, go forth, my intrepid XRD explorer Ayshwarya Ravikumar, and may your liposomes dance harmoniously with the ITO slide, revealing the secrets of their structure!
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Raffinement for XRD pattern of Kaolin, Metakaolin and Geopolymer cement for quantification of cristalline and amorphous phases
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Hello.
I think I can help you with this task. About the percentage of amorphous phase, I must review the methods to determine it, but I think we can handle this.
Sincerely,
Ricardo Tadeu
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I incorporated magnetic nanoparticles into MOF and the MOF XRD peaks shifted towards the left side. What should the possible reasons be?
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Hello Mustafa Kamal.
The peaks in a XRD pattern represent the crystallographic planes, like 111, 100, 200, etc. The position of each peak is determined by the Braggs' Equation:
n . Lambda = 2 . d . sin(theta)
Each crystallographic plane has a interplanar distance (d), and with the wavelength used by the equipment, you can solve this equation for theta and find the position of each peak.
If your peaks shifted, it means that the values of interplanar distances (d) changed. So, your unit cell dimensions changed, and if the peaks shifted to the left, it means that your unit cell got bigger.
Please feel free to reply if you need more help.
Sincerely,
Ricardo Tadeu.
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I have used the equal amount of same salt of two different metal like CuCl2 and ZnCl2, Oxidation of both metal is same but XRD peaks of only one metal has appeared. Even that both metal have their XRD peaks at different angles. If un-equal amount is used then one metal has broad peaks while 2nd metal is has minor peaks. Please guide.
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Noor Hassan If you are observing X-ray diffraction (XRD) peaks of one metal in a composite material synthesized using equal amounts of CuCl2 and ZnCl2 can be influenced by factors such as crystal structure, phase competition, amorphous phase formation, solubility, and reaction kinetics. Unequal amounts may result in a dominant phase or crystal structure associated with the metal in higher concentration. Other characterization techniques, such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), or energy-dispersive X-ray spectroscopy (EDS), can help you better understand the morphology, structure, and composition of the composite material.
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Crystals A were left to boil at 45 degrees Celsius for 5 minutes, Crystals B were left for 45 minutes at 45 degrees Celsius and crystals C were left to boil for 24 hours in 45 degrees Celsius. The following images are of the XRD graphs and crystal sizes viewed on a SEM. The XRD graphs have sample A, B and C on the top of the graph. Crystals A, B and C are below and labelled in the file name. Does anyone know how to describe the crystals obtained from the SEM. Also how to describe the crystals using the graphs? Thank you. There is a scale on the bottom of each SEM image to measure the crystal thickness but im not sure how to calculate it. We also have to calculate the average crystallite thickness using the Scherrer Equation, if anyone is able to figure that out. Thank you!
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SEM definitely showed issues of morphology of your crystals, which can be in the same physical or polymorphic form though. XRPD or PXRD demonstrated the similar traces, dominated with each (particularly Sample A) strongly favoured different orientation. Three traces can be generated by the same form as well. You need further investigation to confirm if they are in the same form or not, and if not check the form purity with respect of each physical form? At least they are not pure regarding morphology.
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The present study focuses on the investigation of Cu-Cr co-substituted M-type barium hexaferrites, specifically for its potential use in lossless low-frequency applications. The research examines several aspects of these materials, including their dielectric properties, surface morphology, thermal behavior, magnetic properties, and Raman spectroscopic features. Several samples of M-type BaCuxCrxFe12-2xO19 were synthesized using a green technique that included the use of an extract derived from mentha plants. After being subjected to a temperature of 1100°C, the samples were subjected to several analytical techniques including structural analysis, thermal analysis, magnetic analysis, Raman spectroscopy, and low frequency dielectric testing. The X-ray diffraction (XRD) results revealed the presence of two distinct phases, namely the M-phase and the secondary BaFe2O4. The observed samples had a characteristic of being hard magnetic, characterized by the presence of multi-domain structures. Additionally, the use of Raman spectroscopy provided confirmation that the Fe ions had effectively substituted the Cu and Cr ions. https://lnkd.in/dFFCTRp4 #HexaferriteResearch #GreenSynthesis #MagneticMaterials
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What is the question?
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Does anyone knows what is the minimum thickness of metallic coating to avoid supstrata signal in XRD or EDS measurements.. For example, MoFe alloy on Fe supstrate.
Thanks in advance
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For x-ray penetration depth and XRD information depth please see:
Please note thate these 'depths' are the 1/e values.
Best regards
G.M.
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I just performed a XRD analysis on a metallic glass particle and got an amorphous halo around 2(theta)=44 degree. How can I justify why the peak appears around 44 degrees?
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the amorphous halo or the broad 'humps' in the XRD pattern of amorphous sample are due to the superposition of the scattered x-ray waves ejected from of the nearest neighbour atoms in the amorphous sample.
Here the radial distribution function(RDF) and/or the pair distribution functions (PDF) of the arrangements of the atoms the sample play a role.
Your 44° is a consequence of the local geometrical arrangement of your metallic glass atoms'. Please 'google' for 'metallic glass XRD' and you can see some XRD pattern peaking around 40 to 44°.
Some more details and links with respect to the evaluation of amorphous XRD pattern please see my answer at a recent question on this topic:
Best regards
G.M.
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I have prepared a glass sample with rare earth doping. My XRD is as below. Please give suggestions. why this graph got hump, i am confused whether it is correct or wrong. If wrong please suggest me, what corrections has to be done. How to understand the XRD graph. I want go for other characteristics if this result is good, suggest me the other characteristics
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I think, you have expected to see an XRD pattern having a few 'crystalline' peaks of well defined small peak withs, well defined peak positions and well defined relative peak heights, which may exhibit slight changes, when your glass sample is doped.
But on the contrary you only see one or even two broad humps.
Unfortunately the structure of most glass sample is amorphous, that means, that there is no long range periodical order of the atoms or 'molecules' in your sample present.
This amorphous state reflects itself in a hump-structure of the XRD pattern.
You can imagine, that a peak shift, or better in your case a slight hump shift or even a slight change of the hump with due to the dopand cannot be seen due to its low concentration.
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In this study, a series of M-type lanthanum-substituted strontium cobalt hexaferrites, denoted as Sr0.5Co0.5LaxFe12-xO19 (with x values of 0.0, 0.05, 0.15, and 0.2), were meticulously synthesized using a straightforward heat treatment method. The subsequent calcination process at 950 °C and 1050 °C for 3 hours in a muffle furnace, followed by gradual cooling to room temperature, ensured the formation of hexagonal ferrites with controlled lanthanum content.
The structural and magnetic characteristics of the prepared samples were thoroughly investigated using X-ray diffraction (XRD) technique and magnetic hysteresis loops, respectively. The XRD analysis unveiled the presence of M-type hexagonal ferrite and hematite phases in all samples, indicating the successful synthesis of the desired materials. Notably, the magnetic hysteresis loops analysis at room temperature demonstrated a discernible increase in saturation magnetization with the progressive substitution of lanthanum.
This research contributes valuable insights into the tailored fabrication of M-type hexaferrites with tunable magnetic properties, holding significance for applications in diverse fields such as electronics and magnetism.
#MaterialsScience #Research #Hexaferrites #MagneticProperties
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Informative 👌
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This study presents the first report on Nd-NbZn co-substituted M-type Ca-Sr hexaferrites with nominal compositions Ca0.4Sr0.6-xNdxFe12.0-x(Nb0.5Zn0.5)xO19 (x = 0.00–0.32) fabricated by the conventional solid-state reaction method. X-ray diffractometer (XRD), Fourier transformer infrared (FTIR) spectroscopy, field emission scanning electron microscopy (FE-SEM), and physical property measurement system-vibrating sample magnetometer (PPMS-VSM) were employed to characterize the hexaferrites. The XRD patterns showed the single M-type hexaferrite phase, while for the hexaferrites with Nd-NbZn content (x)≥ 0.24, the impurity phase (α-Fe2O3) was observed. FT-IR frequency bands in the range (592–613) cm−1 and (430–470) cm−1 corresponded to the formation of tetrahedral and octahedral clusters of metal oxides in the hexaferrites, respectively. FE-SEM micrographs showed that the grains were platelet-like shapes
#spectroscopy#magnetometer#micrographs#X-ray
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Interesting
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Conducted an extensive study on hexaferrites, substituting Erbium into X-type Ba2Co2ErxFe28-xO46 through a precise heat treatment process. XRD analysis highlighted phase variations, showcasing distinct X, W-type, and α-Fe2O3 phases in x = 0.0 samples, while Er-substituted samples exhibited the presence of X and W phases. The room temperature Mössbauer spectra, meticulously fitted with five sextets, elucidated a variation in saturation magnetization (MS). The pinnacle magnetic properties, with MS at 52.29 Am2/kg and anisotropy field-Ha at 1370 kA/m, were observed for x = 0.12 composition. Further, a comprehensive exploration of dielectric responses, from low frequency (20 Hz–2 MHz) behaviors attributed to grain boundaries to higher frequencies associated with grain contributions, was conducted. The findings suggest potential applications in filters owing to the soft ferrite behavior and low dielectric loss tangent exhibited by the substituted compositions. This research contributes valuable insights to the field of materials science and magnetism.
The study focuses on the preparation and characterization of Erbium-substituted hexaferrites (Ba2Co2ErxFe28-xO46) using a heat treatment method. Key aspects include XRD investigation revealing phase variations, Mössbauer spectroscopy explaining saturation magnetization (MS) variation, and identification of optimal magnetic properties at x = 0.12 (MS: 52.29 Am2/kg, anisotropy field-Ha: 1370 kA/m). The research delves into dielectric responses, attributing low-frequency behavior to grain boundary contributions and high-frequency behavior to grain contributions. The findings suggest potential applications in filters due to soft ferrite behavior and a low dielectric loss tangent exhibited by the substituted compositions.
#MaterialsScience #Research #Hexaferrites #MagneticProperties #DielectricAnalysis #Innovation
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Good work 👏
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The fabrication of X-type samarium-cadmium co-substituted hexaferrite was conducted using a thermal treatment approach at a temperature of 1340°C for the purpose of study. The samples were characterised using low-frequency dielectric measurements, Fourier-transform infrared spectroscopy (FTIR), X-ray diffraction (XRD), scanning electron microscopy (SEM), vibrating sample magnetometry (VSM), and Mössbauer spectroscopy. The primary phases that were generated were identified as X and hematite using X-ray diffraction (XRD) examination. The magnetic saturation (MS) value shown a range spanning from 67.01 Am2/kg to 50.43 Am2/kg. Moreover, compositions characterised by x = 0.06 and y = 0.3 showed a relatively low coercivity (Hc) value. The narrow hysteresis loops were observed in hexaferrites with magnetic flexibility. The Mossbauer spectra demonstrated the existence of doublets. These materials enable many applications such as lossless low-frequency applications, electromagnet design, transformer core manufacturing, and electric motor building. #MagneticSoftMaterials #CoercivityAnalysis
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Good Work
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A series of samarium-cadmium co-substituted hexaferrites, represented by the formula Ba2-xSmxCo2CdyFe28-yO46, were synthesized through a straightforward heat treatment method at 1340 °C. Characterization of the samples involved various techniques such as FTIR, XRD, SEM, VSM, Mӧssbauer, and low-frequency dielectric measurements. XRD analysis revealed the dominant presence of the desired phase (denoted as X) alongside hematite. The magnetic saturation (MS) ranged from 67.01 Am2/kg to 50.43 Am2/kg, while coercivity (Hc) varied from 2.95 kA/m to 6.17 kA/m. The pure sample exhibited a notably high MS value (67.01 Am2/kg), while the composition with x = 0.06, y = 0.3 displayed a remarkably low Hc value (2.95 kA/m), indicating potential applications in electromagnets, transformer cores, and electric motors. However, the Mr/Ms ratio below 0.5 affirmed the multi-domain nature of the hexaferrites. Hysteresis loops of all samples demonstrated narrow characteristics, confirming their magnetically soft nature. Mössbauer spectra of selected samples (S1, S3, and S5) exhibited doublets. The observed low values of coercivity, retentivity, and loss tangent in samarium-cadmium substituted samples suggested their suitability for lossless low-frequency applications.
#hexaferrites
#characterizations
#materialsynthesis
#scientificresearch
#materialscience
#electromagnets
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Good
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Researchers developed X-type samarium-cadmium co-substituted hexaferrite, with composition Ba2xSmxCo2CdyFe28-yO46 (0.00 ≤ x ≤ 0.08 and 0 ≤ y ≤ 0.4). The material was prepared by heat treatment technique at 1340°C and was characterized using FTIR, XRD, SEM, VSM, Mössbauer and low-frequency dielectric measurements. The XRD of the prepared samples showed the formation of X as a major phase along with hematite. The MS value varied from 67.01 Am2/kg to 50.43 Am2/kg; whereas the Hc value changed from 2.95 kA/m to 6.17 kA/m. A high value of MS (67.01 Am2/kg) was observed in the pure sample, and a very low value of Hc (2.95 kA/m) was observed for x = 0.06, y = 0.3 compositions. Hysteresis loops of all samples are narrow and confirmed that formed samples were magnetically soft. Mössbauer spectra of the three samples (S1, S2 and S3) show the existence of doublets. Significantly low values of coercivity, retentivity and loss tangent in Sm-Cd substituted samples signified those prepared materials can be used to design electromagnets, transformer cores, electric motors and maybe a potential candidate for losses low-frequency applications. The research has shown that X-type samarium-cadmium co-substituted hexaferrite is a promising new material for a variety of applications, including electromagnets, transformer cores, electric motors and lossless low-frequency applications.
#Research
#MaterialScience
#Magnetism
#Technology
#Hexaferrite
#Innovation
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Nice work